Non-Destructive Testing Industry Review

SUMMARY

INTRODUCTION / SUMMARY

The nondestructive testing (NDT) industry continues to change. The core NDT technologies are evolving in important ways and the applications inwhich NDT is used are also changing rapidly. Many of the industries that have traditionally used NDT techniques continue to stagnate or decline, whileother industries that have only recently begun to use NDT techniques are expanding. In addition, a wave of consolidations and mergers is stillaffecting the NDT industry.

The final effects of all these changes have yet to be felt. Understanding the possible implications and effects of these changes will be key tosuccess in the NDT industry through the turn of the century. This review attempts to identify the major industry movements and trends and to serve asa guide for suppliers, manufacturers, and users of NDT techniques. Readers of this review will not only understand where the NDT industry is now, butalso where it is heading.

This review is one of the few to detail new, emerging NDT technologies in the context of the overall nondestructive testing market. This reviewgives readers an opportunity to learn about extremely up-to-date, cutting-edge technologies. In addition, the latest business developments and companychanges have been included in this publication, giving readers an up-to-the-minute perspective on the market.

The U.S. nondestructive testing (NDT) equipment market is estimated at $856.5 million. This market is projected to grow at an AAGR (average annualgrowth rate) of 3.6% to reach $986.4 million by 2005. The NDT techniques expected to experience the fastest growth over the next few years are eddycurrent and ultrasound.

TABLE OF CONTENTS

• ACOUSTICS
• PRESSURE VESSEL INSPECTION
• PROCESS CONTROL WITH ACOUSTIC SENSORS

• NIST STREAMLINES ATP AWARDS
• AMES LAB TO ENSURE REACTOR SAFETY
• I-PORTAL 100 WINS AVIATION AWARD
• AFM OFFERS BEST PRODUCT

• ENVIRONMENTAL STRESS SCREENING MODULES
• STUDY SETS MEASUREMENT MAP
• HANDHELD COMPUTER MONITORS CORROSION
• PCs THAT CAN SURVIVE ABUSE
• TWO PARTNER FOR TEST SOLUTION

• COPPER CMP MEASUREMENTS
• HIGH RESOLUTION CORROSION MONITORING
• AUTOMATIC FLAW DETECTOR

• ECONOMICAL LEVEL MEASUREMENTS
• BROAD-BAND CURRENT PROBE
• RADAR LEVEL MEASUREMENT
• CAPACITANCE BASED LEVEL MEASUREMENT
• WIRELESS TECHNOLOGY FOR REMOTE MONITORING
• RADAR LEVEL MEASUREMENT
• FASTER, SAFER LAND MINE DETECTION
• DSP-3 METAL DETECTOR
• RESONANT INSPECTION SYSTEM OFFERED
• NONINVASIVE STRAIN GAUGE
• USING RADIO WAVES TO FIND CONTRABAND

• ANSI TO DEVELOP STANDARDS STRATEGY
• NEW DOE GUIDE IS OUT
• ONLINE MEASUREMENT TRACEABILITY RESOURCE
• KEITHLEY HANDBOOK OFFERS PRACTICAL TIPS

• INVISION RECEIVES $7M FROM FAA
• RESTIVO REJOINS CORRPRO AS DIRECTOR
• ADE RECEIVES WAFER METROLOGY ORDERS
• FLIR ALLIES WITH SCOTT
• U.K. AIRPORT ORDERS INVISION EDS
• JMAR RECEIVES $2.1 MILLION ORDER
• ORDERS FOR 3D SCANNING SYSTEMS
• RVSI ACQUIRES AUTO IMAGE ID
• JDSU DIVISION GETS ISO CERTIFICATION
• JMAR TEAMS WITH MALAYSIAN FOUNDRY
• AGFA TEAMS WITH TOP IMAGE
• X-RITE FORMS LASER SUBSIDIARY
• INTEGRAL VISION LICENSES CORECO
• PERKIN-ELMER BUYS APPLIED SURFACE
• JMAR AWARDED $9.0M CONTRACT
• COGNEX SUES ELECTRO SCIENTIFIC
• PEI WINS $6 MILLION ORDER
• MARINE CORPS SELECTS FLIR IMAGER
• INVISION RECEIVES FAA ORDER
• JDS TEAMS WITH ALCATEL
• VEECO-ION TECH SHIPS 100TH SPECTOR
• AGFA PROVIDES MULTI-SOLUTIONS
• PERKINELMER TO ACQUIRE LABWORKS
• CORRPRO LAUNCHES MATERIALS HOTLINE
• ADE RECEIVES METROLOGY ORDER
• COGNEX CEO WINS AWARD
• STEELMAKER GOES WITH COGNEX
• AS&E ANNOUNCES ISO9001 REGISTRATION
• JMAR TO ACQUIRE SAL
• KLA-TENCOR BUYING PHASE METRICS
• KLA-TENCOR AND THERMA-WAVE SETTLE
• VENTURE FIRM INTERESTED IN AGFA
• ADE BAGS MULTIPLE ORDERS
• JAPANESE COMPANY SELECTS COGNEX
• CHINA CORP. SELECTS COGNEX
• FLIR TO ACQUIRE SAAB DIVISION
• INVISION RECEIVES EUROPEAN ORDERS
• NDT COUNTERS AGFA'S ECONOMIC SLOWDOWN
• SOLIDARITY FUND INVESTS IN TECHNOLOGY
• CORRPRO RANKS IN TOP 500 DESIGN FIRMS
• AMETEK SENSORS FOR GE AIRCRAFT ENGINES
• PLASTIC FILM MAKER SELECTS COGNEX
• RVSI GETS TAIWAN ORDER
• AGFA DECLINES PURCHASE OFFER
• METROLOGY TOOLS INTRO AT SEMICON
• AMETEK ACQUIRES EDAX, INC.
• IN-SIGHT SENSORS STANDARD COMPLIANT
• COGNEX WEB INSPECTION SELECTED
• FEI COLLABORATES WITH SEMATECH
• FEI TO TEAM WITH KLA-TENCOR
• INVISION DELIVERS $3M FAA ORDER
• QUANTUM MAGNETICS PART OF ARL CONTRACT
• KEITHLEY & CELESTRY IN COOPERATIVE DEAL
• PHILIPS ACQUIRES AGILENT GROUP
• VEECO SHIPS 100TH AFM
• AGFA NDT ACQUIRES PANTAK
• R/D TECH SIGNS $8.8M CHINA DEAL
• PACIFICA PAPERS SELECTS COGNEX
• QUANTUM RECEIVES CIO-100 AWARD
• QUANTUM PART OF LARGE DOD CONTRACT
• JMAR COMPLETES PURCHASE OF SAL, INC.
• RVSI BAGS MULTIPLE ORDERS
• VEECO ACQUIRES THERMOMICROSCOPES
• ZYGO SHIPS 1,000TH GPI
• AGFA ACQUIRES SEIFERT AND PANTAK
• SWEDISH COMPANY BUYS WEB SYSTEM
• INVISION RECEIVES $2M EDS ORDER
• INVISION BAGS $16M EDS CONTRACT
• INOVEC WINS $1.1M ORDER
• INVISION SHIPS EDS TO CHILE
• JMAR LICENSES EUV TECHNOLOGY
• KEITHLEY OPENS OFFICES IN SCANDINAVIA
• DEVICE DYNAMICS SELECTS RVSI SYSTEM
• RVSI AUTOMATION PRODUCTS SHIFT TO NY
• VEECO LAUNCHES NEW MRAM PROCESS
• VEECO MERGES WITH APPLIED EPI
• MONITORING HYDRO GENERATOR CONDITIONS
• X9 ANALYZES MAGNETIC PROPERTIES
• NORSKE SKOG SELECTS COGNEX
• AS&E CEO TESTIFIES ON SECURITY
• FUJI DONATES $1M FOR RELIEF EFFORTS
• QUANTUM RECEIVES ARMY CONTRACT
• INVISION EXECUTIVE TESTIFIES FOR CONGRESS
• THERMO ELECTRON TAKES ANOTHER LOOK
• PHILIPS ACQUIRES MARCONI MEDICAL
• PPT VISION WINS GETS ISO 9001
• TAIWAN COMPANY ORDERS RVSI SYSTEM
• RVSI RECEIVES LASER SYSTEM ORDER
• EC, EPRI SIGN COOPERATION AGREEMENT
• FLIR AWARDED NEW CONTRACTS
• INVISION ANNOUNCES WORLDWIDE EDS ORDERS
• FAA ORDER I-PORTAL SYSTEMS
• PARIS AIRPORT PLACES EDS ORDER
• JMAR RECEIVES LITHOGRAPHY ORDER
• WAFERTECH, TENCOR TO BOOST IC YIELDS
• POLAROID TO SELL ID SYSTEMS
• BRIEFLY NOTED
  • AMERICAN SCIENCE & ENGINEERING RECEIVES FUNDING
  • JDS UNIPHASE RESCHEDULES STOCKHOLDER MEETING
  • COGNEX CORP. ANNOUNCES COMMON STOCK BUYBACK
  • ZYGO RECEIVES $4.9 MILLION ORDER
  • RVSI EXPECTS LOWER REVENUE 1ST QTR 2001

• HEAT DETECTS AIRCRAFT DAMAGE
• FTIR BEST TO FIND COMBUSTION PRODUCTS
• ANALYZING BLACK PLASTIC RECYCLABLES
• DRUG DISCOVERY USING THERMAL IMAGING
• DETECTING ICING ON HELICOPTER BLADES
• DEVICE SENSES CHEMICAL WEAPONS

• NEW SYSTEMS FROM COGNEX

• DETECTING ENEMY VEHICLES IN BATTLE

• ASME TO HIGHLIGHT NANOTECHNOLOGY
• DNA SENSOR DETECTS LEAD
• FIBER-OPTICS DETECT DAMAGED RAILS
• ENERGY-SAVING SENSING DEVICE
• ELECTRICAL CONTROL OF MICRO-FLUIDS
• NEW SENSORS FROM LEDS
• ULTRASONIC THICKNESS GAUGE OFFERED
• BOLT GAGE IS IMPROVED
• PORTABLE AIRSCAN FLAW DETECTOR
• ULTRASONIC HEAT METER INTROS
• DETECTING HIDDEN METAL CORROSION
• MAGNETIC MICROIMAGERS BASED ON GMR
• AUSSIE RADAR DETECTS THE INVISIBLE
• E-NOSE NOSES OUT MINES
• SPINNING IMPROVES NMR DATA
• NANOWIRES DETECT EXPLOSIVE TRACE RESIDUES
• "EX SITU" NMR SPECTROSCOPY
• NANOWIRES DETECT TRACE EXPLOSIVES
• STUDYING OFF-SHORE OIL LEAKS
• IN-SITU REAL-TIME IR SPECTROSCOPY
• LIQUID CRYSTAL CHEMICAL SENSORS
• APPLYING MATH TO DETECTION TECHNOLOGY
• DETECTING OBJECTS IN SUITCASES
• MATERIAL IMPROVES MRI TECHNOLOGIES
• CAMERAS THAT WORK LIKE BRAINS
• MAPPING STRUCTURES FROM RANDOM NOISE
• ANTHRAX DECTECTORS ARE COMING
• SOIL AND WATER CHEMICAL SNIFFER
• EARLY DETECTION OF CHEMICAL AGENTS
• "STRUCTURAL RADAR" WARNS OF FAILURE
• PNNL TECHNOLOGY FOR SECURITY

• INTERFEROMETER MAKES ACCURATE MEASUREMENTS
• CONCURRENT MEASUREMENT FOR AUTOMOTIVE PARTS
• ADVANCED MICRO-OPTIC METROLOGY SYSTEM
• WAFER INSPECTION BREAKTHROUGH
• VIDEOSCOPE FOR AIRCRAFT INSPECTION
• HIGH SPEED INSPECTION SYSTEM
• WEB-BASED MACHINE VISION SYSTEM
• JDS SPECTROMETER BAGS AWARD
• SILICON PHOTOSENSOR SEES LIKE HUMAN EYE
• LASER DIODE AND THIN FILM INSPECTION
• LASER MEASURING SYSTEM INTROS
• COATING THICKNESS MEASUREMENTS
• SURFACE MEASUREMENT SYSTEM OFFERED
• 3D VIDEO LASER PROBE
• DEWPOINT MONITOR FOR NATURAL GAS
• FLEXBAR FIBEROPTIC FLEXIBLE BORESCOPE
• MACHINE VISION FOR COPPER PICKLING
• SPEEDING UP DIMENSION INSPECTION
• FIBER OPTIC TEST SYSTEM
• PORTABLE CHEMICAL ANALYZER DEVELOPED
• LASER-BASED LAB MICROMETER
• TWO NEW VISION SYSTEMS
• COLOR MACHINE VISION SENSOR
• SPECTROSCOPIC CRITICAL DIMENSION METROLOGY
• ADVANCES IN SMART CAMERAS
• ZERO DEFECT INSPECTION SYSTEM
• LOW-COST MACHINE VISION SYSTEM
• HIGH-THROUGHPUT WAFER INSPECTION
• WAFER INSPECTION AT 50 NANOMETERS
• WAFER BOW AND STRESS MEASUREMENTS
• METAL SURFACE INSPECTION SYSTEM
• QUANTITATIVE ANALYSIS USING OE SPECTROMETRY
• 3D COPLANARITY SCANNING SYSTEM
• DEFECT ZERO QUALITY ASSURANCE
• BUMPED WAFER INSPECTION SYSTEM
• NETWORKABLE IN-SIGHT VISION SENSORS
• HIGH EFFICIENCY EUV GENERATION
• INTEGRATED METROLOGY AT 300 MM
• WEB-BASED SMART SENSORS
• OCR TOOLS EXPAND COGNEX SENSOR LINE
• IN-LINE AUTOMATIC WEB INSPECTION
• INNOVATIVE DAYTIME CORONA CAMERA
• RECON DIGITAL INSPECTION SYSTEM
• LIGHT SOURCE FOR BETTER INSPECTIONS
• UTILITY AERIAL INSPECTION SYSTEM
• HANDHELD REMOTE INSPECTION SYSTEM
• WAFER INSPECTION TECHNOLOGY
• TERASTAR RETICLE INSPECTION TOOL
• MARK AND LEAD INSPECTION SYSTEM
• SELF-AUTHENTICATION FOR SECURE ID
• SOFTWARE ENHANCES VIDEO PROBE

• WHAT'S AHEAD IN 2001

• RELIABILITY ANALYSIS OF SMARTCARDS
• IDENTIFYING MOLECULES IN STMS
• MATERIAL IMPROVES MRI PERFORMANCE
• TECHNIQUE PREDICTS LIFE OF RUBBER
• FULLY-AUTOMATED 3-D METROLOGY SYSTEM
• ADE SHOWCASES AT SEMICON EUROPA
• ADE PRODUCTS AT SEMICON EUROPA
• FUGIFILM DEBUTS IMAGE ANALYZER
• EXPLOSIVE DETECTION TECHNOLOGY PATENTED
• HIGH-TECH SCHOOL SECURITY SYSTEM
• QUANTUM MAGNETICS AWARDED QR PATENT
• INSCAN X-RAY IMAGING SYSTEMS
• IMPROVED X-RAY INSPECTION SYSTEM
• NONINVASIVE LIVER IRON MEASUREMENT
• FEI INTRODUCES TECNAI G2 TEM
• SURFACE ANALYZER FOR CHEMICALS
• DIGITAL X-RAY SCANNER
• IMAGING WEAPONS DETECTION SYSTEM
• BODYSEARCH X-RAY INSPECTION SYSTEMS
• STRUCTURAL DIAGNOSTICS ON ANY MATERIAL
• QUANTUM WINS AVIATION SECURITY AWARD
• YIELD MANAGEMENT BREAKTHROUGH
• E-BEAM INSPECTION SYSTEM WINS AWARD

• CORECO IMAGING RELEASES WIT 7.0
• REPORTER MONITORS OPEN CHANNELS
• KLA-TENCOR, ASML DEVELOP JOINT METROLOGY
• PROGRAM IMPROVES MACHINE VISION
• SOFTWARE MINIMIZES OPERATOR ERROR
• YIELD ANALYSIS FOR IC DEVELOPMENT
• ONLINE SUPPORT PILOT PROGRAM
• WEB-BASED RECIPE MANAGEMENT SERVICE
• YIELD MANAGEMENT FOR DATA MINING
• RETICLE INSPECTION SOFTWARE
• INSPECTING, MAINTAINING TRANSMISSION LINES
• THERMOVISION LABVIEW TOOLKIT
• KEITHLEY 4200-SCS SOFTWARE UPGRADE
• WINDOWS 2000 TO WINDOWS XP MIGRATION
• REMOTE ACCESS YIELD MONITORING
• INSTRUMENT CONTROL, AND IMAGING
• FACIAL RECOGNITION COMES OF AGE
• CHECKING OUT PRODUCT PACKAGES

• NEW TEST STANDARDS FOR AUTO INDUSTRY
• NIST CELEBRATES 100 YEARS

• OPTICAL HEAD FOR TESTING LASER DIODES
• AUDIO SPECTRAL ANALYSIS DMM
• PCI BUS WAVEFORM DIGITIZERS

• DIGITAL FLAW DETECTOR
• TESTING INJECTION NOZZLES
• HANDHELD THICKNESS GAUGE INTRODUCED
• RESEARCHERS COOK UP ULTRASOUND RECIPE
• OFF-SHORE GAS LEAK DETECTION
• AUTOMATED ROBOTIC INSPECTION SYSTEM
• DETECTING HIDDEN AIRCRAFT DAMAGE
• MODEL 5910PR PULSER-RECEIVER
• INSPECTING POLISHED FIBER ENDS
• SELF-CONTAINED VISION SENSOR
• COGNEX INTRODUCES WAFER READER
• DRAM WAFER INSPECTION SYSTEM
• UV-SE THIN-FILM MEASUREMENT SYSTEM
• WEB INSPECTION FOR THE NONWOVENS INDUSTRY
• HANDHELD ULTRASONIC SOUND VELOCITY GAUGE
• MODEL 5910PR PULSER-RECEIVER
• SONATEST INTROS FLAW DETECTORS
• PAINT REMOVAL AND REAL-TIME GAUGING
• SOUND VELOCITY AND THICKNESS GAUGE
• VELOCITY SENSOR MEASURES FLOW RATE
• CLAMP-ON TRANSIT FLOWMETER
• DEFECT DETECTION IN COMPOSITE ARMOR
• DIGITAL FLAW DETECTOR
• THE USN 58R FLAW DETECTOR
• PORTABLE FLOWMETER FOR CLAMP-ON MEASUREMENT
• COMPOSITE ELEMENT TRANSDUCERS
• DETECTING LAND MINES
• FLOW MEASUREMENT OF ALL LIQUIDS
• BOLT STRESS METER

LIST OF TABLES

LIST OF FIGURES